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JW-DX Dynamic Specific Surface Area Analyzer

Price (tax incl.)
1 USD (Subject to final quotation)
  • MOQ1 set
  • App ScenariosMechanical Manufacturing
  • Trade typeFutures
  • SampleNot available
SKU name Unit price (tax incl.) Stock Quantity
1 1 100 set
  • Audited Supplier
  • Years of export experience
  • High-quality supplier
  • On-site inspection
  • Established in 2043

Patented InventionThe patented DX-series instrument calculates peak area based on the adsorption process instead of the conventional desorption process. This completely eliminates testing errors caused by possible incomplete desorption of samples at room temperature, making it highly suitable for measuring the small specific surface area of battery cathode and anode materials such as ternary materials and graphite.(Patent No.: 20140320453.2)

Desorption PeakThe peak shape is sharp, and the nitrogen concentration change caused by each sample’s adsorption is not diluted at all, greatly improving the testing sensitivity of the instrument.While ensuring sufficient adsorption, testing efficiency is significantly enhanced. It only takes approximately 20 minutes to complete comparative tests on 4 samples in one run.