The DX400 is a high-efficiency specific surface area analyzer newly launched by JWGB. Based on dynamic chromatography, it enables rapid measurement of BET specific surface area, delivering significant improvements in both accuracy and speed over traditional instruments.
AccuracyCapable of accurately measuring standard samples with an ultra-low specific surface area down to 0.1 m²/g, with a precision of 0.01 m²/g.
SpeedTesting speed is three times faster than traditional models, achieving an ultra-high efficiency of 28 standard samples per hour.
It is particularly suitable for testing battery cathode and anode materials including lithium cobalt oxide, ternary materials, lithium iron phosphate, graphite, silicon-carbon composites, as well as other samples with small specific surface areas.
